PTFEIntegrating Sphere

Introduction

PTFE integrating sphere is made of high-quality ≥98.5% PTFE material by high-temperature sintering, suitable for UV-visible-near-infrared spectrum, with near-perfect Lambertian characteristics. The coating is stable and durable, ensuring ideal optical performance throughout the sphere's service life. Through special process modification, molding, mechanical machining into spherical shell, then polishing and cleaning, its main advantage is thick coating wall that never peels off. It can be combined with spectrometers, optical fibers, light sources and various optical measurement equipment into a system for sample measurement, such as spectral power measurement, sample surface reflectance, sample transmittance, and source irradiance. PIS-50 PTFE integrating sphere is commonly used for wafer probing and chip testing; PIS-100 PTFE integrating sphere is used for single- or multi-chip testing. Laboratories often use PTFE integrating spheres for IR and UV product development.

Technology & Features

• Complete system solution for UV and IR measurement
• Highly sensitive measurement range from 200 nm to 2500 nm
• High-reflectance PTFE material ensuring high optical throughput in key bands such as UV and IR
• Precise radiometric measurement from UV to IR

Applications

Can be combined with spectrometers, optical fibers, light sources and various optical measurement equipment for spectral power measurement, sample reflectance, transmittance, and source irradiance. PIS-50 is commonly used for wafer probing and chip testing; PIS-100 for single- or multi-chip testing. Often used in laboratories for IR and UV product development.